1-4 of 4
T. N. Goh
Close
Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Proceedings Papers

Proc. ASME. IDETC-CIE2007, Volume 4: ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications and the 19th Reliability, Stress Analysis, and Failure Prevention Conference, 605-608, September 4–7, 2007
Paper No: DETC2007-34009
Journal Articles
Journal Articles
Journal Articles
Article Type: Technical Briefs
J. Dyn. Sys., Meas., Control. September 1975, 97(3): 309.
Published Online: September 1, 1975