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Proceedings Papers

Prediction of Extreme Wave Slamming Loads on a Fixed Platform

Grzegorz P. Filip, Wenzhe Xu, Kevin J. Maki
Proc. ASME. OMAE2018, Volume 2: CFD and FSI, V002T08A002, June 17–22, 2018
Paper No: OMAE2018-78179
DOI: https://doi.org/10.1115/OMAE2018-78179
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Topics: Stress, Waves, Seas, Dynamics (Mechanics), Simulation, Computational fluid dynamics, Computer software, Design, Fluids, Ocean engineering
Proceedings Papers

Nano-Scale Indentation Measurement of Material Properties Using an Area Function of the Tip Geometry

S. Ozcan, K. Farhang, P. Filip
Proc. ASME. IMECE2008, Volume 13: Nano-Manufacturing Technology; and Micro and Nano Systems, Parts A and B, 153-161, October 31–November 6, 2008
Paper No: IMECE2008-68762
DOI: https://doi.org/10.1115/IMECE2008-68762
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Topics: Geometry, Materials properties, Nanoscale phenomena, Elastic moduli, Atomic force microscopy, Elasticity, Machinery, Nanoindentation, Stress, Surface properties
Proceedings Papers

Assessment and Verification of a Novel Method for Near Surface Measurement of Mechanical Properties

S. Ozcan, K. Farhang, P. Filip
Proc. ASME. IJTC2006, Part A: Tribomaterials; Lubricants and Additives; Elastohydrodynamic Lubrication; Hydrodynamic Lubrication and Fluid Film Bearings; Rolling Element Bearings; Engine Tribology; Machine Components Tribology; Contact Mechanics, 49-57, October 23–25, 2006
Paper No: IJTC2006-12242
DOI: https://doi.org/10.1115/IJTC2006-12242
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Topics: Atomic force microscopy, Elastic moduli, Elasticity, Geometry, Machinery, Mechanical properties, Nanoindentation, Nanoscale phenomena, Stress, Surface properties
Journal Articles

Assessment and Verification of a Novel Method for Near Surface Measurement of Mechanical Properties

S. Ozcan, K. Farhang, P. Filip
Journal: Journal of Tribology
Article Type: Technical Papers
J. Tribol. April 2007, 129(2): 314–320.
DOI: https://doi.org/10.1115/1.2540550
Published Online: January 9, 2007
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Topics: Atomic force microscopy, Geometry, Mechanical properties, Surface properties, Young's modulus, Stiffness, Stress, Errors, Scanning electron microscopes