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Proceedings Papers

Electrical Properties of Carbon Nanomaterial-Based Structural-Energy Storage Devices

Monica Rivera, Daniel P. Cole, Mark Bundy
Proc. ASME. SMASIS2011, ASME 2011 Conference on Smart Materials, Adaptive Structures and Intelligent Systems, Volume 1, 181-188, September 18–21, 2011
Paper No: SMASIS2011-5169
DOI: https://doi.org/10.1115/SMASIS2011-5169
View Paper titled, Electrical Properties of Carbon Nanomaterial-Based Structural-Energy Storage Devices
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Topics: Carbon, Electrical properties, Nanomaterials, Storage, Vehicles, Energy storage, Weight (Mass), Aircraft, Architecture, Bearings
Proceedings Papers

Characterization of Mechanical Properties in Multifunctional Structural-Energy Storage Nanocomposites for Lightweight Micro Autonomous Systems

Daniel P. Cole, Monica Rivera, Mark Bundy
Proc. ASME. SMASIS2011, ASME 2011 Conference on Smart Materials, Adaptive Structures and Intelligent Systems, Volume 1, 195-199, September 18–21, 2011
Paper No: SMASIS2011-5182
DOI: https://doi.org/10.1115/SMASIS2011-5182
View Paper titled, Characterization of Mechanical Properties in Multifunctional Structural-Energy Storage Nanocomposites for Lightweight Micro Autonomous Systems
Click here to open pdf in another window PDF for Characterization of Mechanical Properties in Multifunctional Structural-Energy Storage Nanocomposites for Lightweight Micro Autonomous Systems
Topics: Mechanical properties, Nanocomposites, Storage, Carbon nanotubes, Composite materials, Electrodes, Design, Inks, Structural elements (Construction), Biosensors
Proceedings Papers

Minimizing Tip-Sample Contact Force in Automated Atomic Force Microscope Based Force Spectroscopy

Monica Rivera, Carleen Morris, David Carlson, Eric J. Toone, Daniel G. Cole, Robert L. Clark
Proc. ASME. IDETC-CIE2009, Volume 6: ASME Power Transmission and Gearing Conference; 3rd International Conference on Micro- and Nanosystems; 11th International Conference on Advanced Vehicle and Tire Technologies, 731-736, August 30–September 2, 2009
Paper No: DETC2009-87378
DOI: https://doi.org/10.1115/DETC2009-87378
View Paper titled, Minimizing Tip-Sample Contact Force in Automated Atomic Force Microscope Based Force Spectroscopy
Click here to open pdf in another window PDF for Minimizing Tip-Sample Contact Force in Automated Atomic Force Microscope Based Force Spectroscopy
Topics: Atomic force microscopy, Spectroscopy, Cycles, Force feedback, Feedback, Noise (Sound), Sensors
Proceedings Papers

Aligning Molecular Attachment Sites in Single Molecule Force Spectroscopy Measurements

Monica Rivera, Whasil Lee, Piotr E. Marszalek, Daniel G. Cole, Robert L. Clark
Proc. ASME. IDETC-CIE2008, Volume 4: 20th International Conference on Design Theory and Methodology; Second International Conference on Micro- and Nanosystems, 663-667, August 3–6, 2008
Paper No: DETC2008-50019
DOI: https://doi.org/10.1115/DETC2008-50019
View Paper titled, Aligning Molecular Attachment Sites in Single Molecule Force Spectroscopy Measurements
Click here to open pdf in another window PDF for Aligning Molecular Attachment Sites in Single Molecule Force Spectroscopy Measurements
Topics: Spectroscopy, Atomic force microscopy, Cantilevers, Errors, Fluctuations (Physics), Geometry, Instrumentation
Proceedings Papers

A Method to Correct Pulling Geometry Induced Errors in Single Molecule Force Spectroscopy Measurements

Monica Rivera, Changhong Ke, Piotr E. Marszalek, Daniel G. Cole, Robert L. Clark
Proc. ASME. IDETC-CIE2007, Volume 3: 19th International Conference on Design Theory and Methodology; 1st International Conference on Micro- and Nanosystems; and 9th International Conference on Advanced Vehicle Tire Technologies, Parts A and B, 801-807, September 4–7, 2007
Paper No: DETC2007-35430
DOI: https://doi.org/10.1115/DETC2007-35430
View Paper titled, A Method to Correct Pulling Geometry Induced Errors in Single Molecule Force Spectroscopy Measurements
Click here to open pdf in another window PDF for A Method to Correct Pulling Geometry Induced Errors in Single Molecule Force Spectroscopy Measurements
Topics: Errors, Geometry, Spectroscopy, Atomic force microscopy, Cantilevers, Instrumentation, Simulation