Manipulating suspended neutrally buoyant colloidal particles of radii a = O (0.1–1 μm) near solid surfaces, or walls, is a key technology in various microfluidics devices. These particles, suspended in an aqueous solution at rest near a solid surface, or wall, are subject to wall-normal “lift” forces described by the Derjaguin–Landau–Verwey–Overbeek (DLVO) theory of colloid science. The particles experience additional lift forces, however, when suspended in a flowing solution. A fundamental understanding of such lift forces could therefore lead to new methods for the transport and self-assembly of particles near and on solid surfaces. Various studies have reported repulsive electroviscous and hydrodynamic lift forces on colloidal particles in Poiseuille flow (with a constant shear rate near the wall) driven by a pressure gradient. A few studies have also observed repulsive dielectrophoretic-like lift forces in electroosmotic (EO) flows driven by electric fields. Recently, evanescent-wave particle tracking has been used to quantify near-wall lift forces on a = 125–245 nm polystyrene (PS) particles suspended in a monovalent electrolyte solution in EO flow, Poiseuille flow, and combined Poiseuille and EO flow through ∼30 μm deep fused-silica channels. In Poiseuille flow, the repulsive lift force appears to be proportional to , a scaling consistent with hydrodynamic, versus electroviscous, lift. In combined Poiseuille and EO flow, the lift forces can be repulsive or attractive, depending upon whether the EO flow is in the same or opposite direction as the Poiseuille flow, respectively. The magnitude of the force appears to be proportional to the electric field magnitude. Moreover, the force in combined flow exceeds the sum of the forces observed in EO flow for the same electric field and in Poiseuille flow for the same . Initial results also imply that this force, when repulsive, scales as . These results suggest that the lift force in combined flow is fundamentally different from electroviscous, hydrodynamic, or dielectrophoretic-like lift. Moreover, for the case when the EO flow opposes the Poiseuille flow, the particles self-assemble into dense stable periodic streamwise bands with an average width of ∼6 μm and a spacing of 2–4 times the band width when the electric field magnitude exceeds a threshold value. These results are described and reviewed here.
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August 2014
Research-Article
Using Shear and Direct Current Electric Fields to Manipulate and Self-Assemble Dielectric Particles on Microchannel Walls
Necmettin Cevheri,
Necmettin Cevheri
G. W. Woodruff School
of Mechanical Engineering,
e-mail: ncevheri@gatech.edu
of Mechanical Engineering,
Georgia Institute of Technology
,Atlanta, GA 30332-0405
e-mail: ncevheri@gatech.edu
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Minami Yoda
Minami Yoda
G. W. Woodruff School
of Mechanical Engineering,
e-mail: minami@gatech.edu
of Mechanical Engineering,
Georgia Institute of Technology
,Atlanta, GA 30332-0405
e-mail: minami@gatech.edu
Search for other works by this author on:
Necmettin Cevheri
G. W. Woodruff School
of Mechanical Engineering,
e-mail: ncevheri@gatech.edu
of Mechanical Engineering,
Georgia Institute of Technology
,Atlanta, GA 30332-0405
e-mail: ncevheri@gatech.edu
Minami Yoda
G. W. Woodruff School
of Mechanical Engineering,
e-mail: minami@gatech.edu
of Mechanical Engineering,
Georgia Institute of Technology
,Atlanta, GA 30332-0405
e-mail: minami@gatech.edu
Manuscript received January 2, 2015; final manuscript received January 16, 2015; published online February 12, 2015. Editor: Boris Khusid.
J. Nanotechnol. Eng. Med. Aug 2014, 5(3): 031009 (8 pages)
Published Online: August 1, 2014
Article history
Received:
January 2, 2015
Revision Received:
January 16, 2015
Online:
February 12, 2015
Citation
Cevheri, N., and Yoda, M. (August 1, 2014). "Using Shear and Direct Current Electric Fields to Manipulate and Self-Assemble Dielectric Particles on Microchannel Walls." ASME. J. Nanotechnol. Eng. Med. August 2014; 5(3): 031009. https://doi.org/10.1115/1.4029628
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