Variation source identification for manufacturing processes is critical for product dimensional quality improvement, and various techniques have been developed in recent years. Most existing variation source identification techniques are based on a linear fault-quality model, in which the relationships between process faults and product dimensional quality measurements are linear. In practice, many dimensional measurements are actually nonlinearly related to the process faults: For example, relational dimension measurements such as the relative distance between features are used to monitor composite tolerances. This paper presents a variation source identification methodology in the presence of these relational dimension measurements. In the proposed methodology, the joint probability density of the measurements is determined as a function of the process parameters; then, series of statistical comparisons are performed to differentiate and identify the variation source. A case study is also presented to illustrate the effectiveness of the methodology.
Skip Nav Destination
e-mail: jploose@wisc.edu
e-mail: szhou@engr.wisc.edu
e-mail: D.J.Ceglarek@warwick.ac.uk
Article navigation
June 2008
Research Papers
Variation Source Identification in Manufacturing Processes Based on Relational Measurements of Key Product Characteristics
Jean-Philippe Loose,
Jean-Philippe Loose
Department of Industrial and Systems Engineering,
e-mail: jploose@wisc.edu
University of Wisconsin-Madison
, Madison, Wisconsin 53706; and Warwick Digital Laboratory, University of Warwick
, Coventry, CV4 7AL, United Kingdom
Search for other works by this author on:
Shiyu Zhou,
Shiyu Zhou
Department of Industrial and Systems Engineering,
e-mail: szhou@engr.wisc.edu
University of Wisconsin-Madison
, Madison, Wisconsin 53706; and Warwick Digital Laboratory, University of Warwick
, Coventry, CV4 7AL, United Kingdom
Search for other works by this author on:
Dariusz Ceglarek
Dariusz Ceglarek
Department of Industrial and Systems Engineering,
e-mail: D.J.Ceglarek@warwick.ac.uk
University of Wisconsin-Madison
, Madison, Wisconsin 53706; and Warwick Digital Laboratory, University of Warwick
, Coventry, CV4 7AL, United Kingdom
Search for other works by this author on:
Jean-Philippe Loose
Department of Industrial and Systems Engineering,
University of Wisconsin-Madison
, Madison, Wisconsin 53706; and Warwick Digital Laboratory, University of Warwick
, Coventry, CV4 7AL, United Kingdome-mail: jploose@wisc.edu
Shiyu Zhou
Department of Industrial and Systems Engineering,
University of Wisconsin-Madison
, Madison, Wisconsin 53706; and Warwick Digital Laboratory, University of Warwick
, Coventry, CV4 7AL, United Kingdome-mail: szhou@engr.wisc.edu
Dariusz Ceglarek
Department of Industrial and Systems Engineering,
University of Wisconsin-Madison
, Madison, Wisconsin 53706; and Warwick Digital Laboratory, University of Warwick
, Coventry, CV4 7AL, United Kingdome-mail: D.J.Ceglarek@warwick.ac.uk
J. Manuf. Sci. Eng. Jun 2008, 130(3): 031007 (11 pages)
Published Online: May 6, 2008
Article history
Received:
October 6, 2006
Revised:
January 2, 2008
Published:
May 6, 2008
Citation
Loose, J., Zhou, S., and Ceglarek, D. (May 6, 2008). "Variation Source Identification in Manufacturing Processes Based on Relational Measurements of Key Product Characteristics." ASME. J. Manuf. Sci. Eng. June 2008; 130(3): 031007. https://doi.org/10.1115/1.2844591
Download citation file:
Get Email Alerts
Related Articles
Automated Surface Defect Detection Using High-Density Data
J. Manuf. Sci. Eng (July,2016)
Assessing Circularity in Three Dimensions
J. Manuf. Sci. Eng (February,2001)
Quantifying and Qualifying Alloys Based on Level of Homogenization: A U-10Mo Alloy Case Study
J. Eng. Mater. Technol (January,2020)
Related Proceedings Papers
Related Chapters
Methods to Select and Compound Noise Factors
Taguchi Methods: Benefits, Impacts, Mathematics, Statistics and Applications
Getting Ready for Production
Total Quality Development: A Step by Step Guide to World Class Concurrent Engineering
Multiple Smoothing and Morphological Techniques in Radiographic Image Enhancement
International Conference on Computer Engineering and Technology, 3rd (ICCET 2011)