In this paper, theoretical and experimental work on stylus flight is described. Experiments on the surfaces of different roughness specimens with sinusoidal, rectangular, triangular and random waveforms support the theoretical model, which predicts stylus flight from the traversing speed, stylus force, stylus radius and parameters of the surface.
Issue Section:
Research Papers
1.
ISO 4287/2, Surface Roughness—Terminology—Part 2: Measurement of Surface Roughness Parameters, 1984 (International Standards Organization, Geneva.
2.
Scott
P. J.
1988
, “Developments in Surface Texture Measurement
,” Surface Topography
, Vol. 1
, p. 153
153
.3.
Thomas, T. R., 1982, Rough Surfaces, Longman, London.
4.
Bennett, J. M., and Mattsson, L., 1990, Introduction to Surface Roughness and Scattering, Optical Society of America, Washington, DC.
5.
Radhakrishnan
V.
1970
, “Effect of Stylus Radius on the Roughness Values Measured with Tracing Stylus Instruments
,” Wear
, Vol. 16
, p. 325
325
.6.
Song
J. F.
Vorburger
T. V.
1991
, “Stylus Profiling at High Resolution and Low Force
,” Appl. Opt.
, Vol. 30
, p. 42
42
.7.
Song
J. F.
1988
, “Random Profile Precision Roughness Calibration Specimens
,” Surface Topography
, Vol. 1
, p. 303
303
.8.
Vorburger, T. V., and Hembree, G. G., 1989, “Characterization of Surface Topography,” Navy Metrology Research and Development Program Conference Report, Dept. of Navy, Corona, CA, p. 55.
9.
Damir
M. N. H.
1973
, “Error in Measurement Due to Stylus Kinematics
,” Wear
, Vol. 26
, p. 219
219
.10.
McCool
J. I.
1984
, “Assessing the Effect of Stylus Tip Radius and Flight on Surface Topography Measurements
,” Trans. ASME
, Vol. 106
, p. 202
202
.11.
Webster
M. N.
Sayles
R. S.
1986
, “A Numerical Model for the Electric Frictionless Contact of Real Rough Surfaces
,” Tribology
, Vol. 108
, p. 134
134
.12.
Song
J. F.
Vorburger
T. V.
1991
, “Standard Reference Specimens in Engineering Surface Quality Control
,” J. Res. NIST
, Vol. 96
, p. 271
271
.13.
Berger
J.
1988
, “A New Surface Roughness Standard Fabricated Using Silicon Technology
,” Surface Topography
, Vol. 1
, p. 41
41
.14.
Teague
E. C.
Scire
F. E.
Vorburger
T. V.
1982
, “Sinusoidal Profile Precision Roughness Specimens
,” Wear
, Vol. 83
, p. 61
61
.15.
NIST Standard Reference Materials Catalog, 1992–93, N. M. Trahey, ed., SP260, National Institute of Standards and Technology, Gaithersburg, MD, p. 125.
16.
Halliday, J. D., and Resnick, R., 1961, Physics, John Wiley & Sons, New York, p. 123.
17.
ANSI/ASME B46. 1–1985, Surface Texture—Surface Roughness, Waviness and Lay, 1985, American Society of Mechanical Engineers, New York.
18.
Vorburger
T. V.
Scire
F. E.
Teague
E. C.
Rosberry
F. R.
1979
, “Measurement of Stylus Radii
,” Wear
, Vol. 57
, p. 39
39
.19.
Fu
J.
Young
R. D.
Vorburger
T. V.
1992
, “Long-range Scanning for Scanning Tunneling Microscopy
,” Rev. Sci. Instrum.
, Vol. 63
, p. 2200
2200
.20.
ISO 3274–1975, Instruments for the Measurement of Surface Roughness by the Profile Method—Contact (Stylus) Instruments of Consecutive Profile Transformation—Contact Profile Meters, System M, 1975 International Standards Organization, Geneva.
21.
Hasing
J.
1965
, “Herstellung und Eigenschaften von Referenznormalen fur das Elnstellen von Oberflachenmeßgeraten
,” Werkstattstechnk
, Vol. 55
, p. 380
380
.22.
Shull
R. D.
Atzmony
Y.
Shapiro
A. J.
Swartzendruber
L. J.
Bennett
L. H.
1988
, “Magnetic Properties of Thin-Film Ag + Iron-oxide Granular Metals
,” J. Applied Physics
, Vol. 63
, p. 8
8
.23.
Weisenhorn
A. L.
Hansma
P. K.
Albrecht
T. R.
Quate
C. F.
1989
, “Forces in Atomic Force Microscopy in Air and Water
,” Applied Physics Letters
, Vol. 54
, p. 2651
2651
.
This content is only available via PDF.
Copyright © 1996
by The American Society of Mechanical Engineers
You do not currently have access to this content.