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Keywords: distributed parameter systems
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Journal Articles

Active Thermal Control of Distributed Parameter Systems Excited at Multiple Frequencies

Christoph C. Richter, John H. Lienhard, V
Journal: ASME Journal of Heat and Mass Transfer
Publisher: ASME
Article Type: Technical Briefs
J. Heat Mass Transfer. January 2006, 128(1): 93–99.
https://doi.org/10.1115/1.2130408
Published Online: February 10, 2005
..., MA. Sweetland , M. , and Lienhard , V. J. H. , 2003 , “ Active Thermal Control of Distributed Parameter Systems With Application to Testing of Packaged (IC) Devices ,” ASME J. Heat Transfer 0022-1481 , 125 , pp. 165 – 174 . Richter , C. C. , 2004 , “ Active Thermal...
View Article titled, Active Thermal Control of <span class="search-highlight">Distributed</span> <span class="search-highlight">Parameter</span> <span class="search-highlight">Systems</span> Excited at Multiple Frequencies
Open the PDF for Active Thermal Control of <span class="search-highlight">Distributed</span> <span class="search-highlight">Parameter</span> <span class="search-highlight">Systems</span> Excited at Multiple Frequencies in another window
Topics: Temperature
Journal Articles

Active Thermal Control of Distributed Parameter Systems With Application to Testing of Packaged IC Devices

Matthew Sweetland, Mem. ASME, John H. Lienhard, V, Fellow ASME
Journal: ASME Journal of Heat and Mass Transfer
Publisher: ASME
Article Type: Technical Papers
J. Heat Mass Transfer. February 2003, 125(1): 164–174.
https://doi.org/10.1115/1.1527908
Published Online: January 29, 2003
... 01 2003 thermal variables control temperature control distributed parameter systems integrated circuit design integrated circuit packaging Conduction Control Electronics Heat Transfer Temperature All high-performance electronic devices are subject to a 100 percent...
View Article titled, Active Thermal Control of <span class="search-highlight">Distributed</span> <span class="search-highlight">Parameter</span> <span class="search-highlight">Systems</span> With Application to Testing of Packaged IC Devices
Open the PDF for Active Thermal Control of <span class="search-highlight">Distributed</span> <span class="search-highlight">Parameter</span> <span class="search-highlight">Systems</span> With Application to Testing of Packaged IC Devices in another window
Topics: Temperature