This article develops low cost moiré deflectometry for two-dimensional temperature measurement in free boundary environment. Experimental setup uses a red monochrome light-emitting diode (LED) lamp with wavelength range of 625–635 nm as light source. In process, the light first runs through the convex lens and then propagates to the parabolic mirror with diameter of 406 mm and f/4.5 for generating the parallel light. The parallel light further propagates to test object and through two gratings both with pitch of 254 lpi which are printed by laser printer. Behind the two gratings, a CCD camera is applied to capture the image, the distorted fringes. Based on the moiré deflectometry theory, the two-dimensional temperature distribution in free boundary environment can be determined in terms of the captured fringe shift analysis. This work has successfully measured the two-dimensional temperature distribution in free boundary environment with heat source models of 40–95 °C vertical wall, 60 W light bulb, and burning candle flame. The measured temperature deviations between moiré deflectometry and thermocouple thermometer are all less than 5%.
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A Monochrome Light-Emitting Diode Moiré Deflectometry Technique for Two-Dimensional Temperature Measurement
Jing-Nang Lee,
Jing-Nang Lee
Department of Refrigeration,
Air Conditioning and Energy Engineering,
e-mail: jnl@ncut.edu.tw
Air Conditioning and Energy Engineering,
National Chin-Yi University of Technology
,Taichung
41170, Taiwan
e-mail: jnl@ncut.edu.tw
Search for other works by this author on:
Chien-Chih Chen
Chien-Chih Chen
Graduate Institute of Mechanical
and Electrical Engineering,
e-mail: t8669030@ntut.edu.tw
and Electrical Engineering,
National Taipei University of Technology
,Taipei
10608, Taiwan
e-mail: t8669030@ntut.edu.tw
Search for other works by this author on:
Jing-Nang Lee
Department of Refrigeration,
Air Conditioning and Energy Engineering,
e-mail: jnl@ncut.edu.tw
Air Conditioning and Energy Engineering,
National Chin-Yi University of Technology
,Taichung
41170, Taiwan
e-mail: jnl@ncut.edu.tw
Chien-Chih Chen
Graduate Institute of Mechanical
and Electrical Engineering,
e-mail: t8669030@ntut.edu.tw
and Electrical Engineering,
National Taipei University of Technology
,Taipei
10608, Taiwan
e-mail: t8669030@ntut.edu.tw
Contributed by the Heat Transfer Division of ASME for publication in the JOURNAL OF HEAT TRANSFER. Manuscript received August 5, 2013; final manuscript received July 1, 2014; published online July 29, 2014. Assoc. Editor: Cila Herman.
J. Heat Transfer. Oct 2014, 136(10): 101601 (7 pages)
Published Online: July 29, 2014
Article history
Received:
August 5, 2013
Revision Received:
July 1, 2014
Citation
Lee, J., and Chen, C. (July 29, 2014). "A Monochrome Light-Emitting Diode Moiré Deflectometry Technique for Two-Dimensional Temperature Measurement." ASME. J. Heat Transfer. October 2014; 136(10): 101601. https://doi.org/10.1115/1.4027978
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