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Issues
March 2006
ISSN 1043-7398
EISSN 1528-9044
In this Issue
Research Papers
Experimental and Computational Investigation of Flow Development and Pressure Drop in a Rectangular Micro-channel
J. Electron. Packag. March 2006, 128(1): 1–9.
doi: https://doi.org/10.1115/1.2159002
Topics:
Flow (Dynamics)
,
Microchannels
,
Pressure drop
,
Reynolds number
Models of Steady Heat Conduction in Multiple Cylindrical Domains
J. Electron. Packag. March 2006, 128(1): 10–17.
doi: https://doi.org/10.1115/1.2159003
Topics:
Boundary-value problems
,
Geometry
,
Heat
,
Heat conduction
,
Heat flux
,
Heat sinks
,
Integrated circuits
,
Temperature
,
Thermal conductivity
,
Thermal management
An Experimental Investigation of a High Flux Heat Pipe Heat Sink
J. Electron. Packag. March 2006, 128(1): 18–22.
doi: https://doi.org/10.1115/1.2159004
Topics:
Air flow
,
Condensers (steam plant)
,
Design
,
Heat
,
Heat pipes
,
Heat sinks
,
Heat transfer
,
Temperature
,
Particulate matter
,
Evaporation
Thermal Joint Resistance of Polymer-Metal Rough Interfaces
J. Electron. Packag. March 2006, 128(1): 23–29.
doi: https://doi.org/10.1115/1.2159005
Topics:
Deformation
,
Metals
,
Polymers
,
Surface roughness
,
Thermal resistance
,
Temperature
,
Microhardness
Implementation of Microchannel Evaporator for High-Heat-Flux Refrigeration Cooling Applications
J. Electron. Packag. March 2006, 128(1): 30–37.
doi: https://doi.org/10.1115/1.2159006
Topics:
Compressors
,
Cooling
,
Heat
,
Heat sinks
,
Microchannels
,
Pressure drop
,
Refrigeration
,
Temperature
,
Compression
,
Heat transfer coefficients
Numerical Analysis of Blockage and Optimization of Heat Transfer Performance of Fractal-like Microchannel Nets
J. Electron. Packag. March 2006, 128(1): 38–45.
doi: https://doi.org/10.1115/1.2159007
Topics:
Flow (Dynamics)
,
Fractals
,
Heat transfer
,
Microchannels
,
Heat sinks
,
Temperature
,
Disks
,
Optimization
,
Fluid dynamics
,
Temperature distribution
Design of Thermal Interface Material With High Thermal Conductivity and Measurement Apparatus
J. Electron. Packag. March 2006, 128(1): 46–52.
doi: https://doi.org/10.1115/1.2159008
Topics:
Network models
,
Resistors
,
Thermal conductivity
,
Thermometers
,
Temperature
,
Carbon nanotubes
,
Thermal resistance
,
Design
A Model for Flow Bypass and Tip Leakage in Pin Fin Heat Sinks
J. Electron. Packag. March 2006, 128(1): 53–60.
doi: https://doi.org/10.1115/1.2159009
Topics:
Flow (Dynamics)
,
Heat sinks
,
Leakage
,
Heat transfer
,
Pressure drop
A Practical Viscoplastic Damage Model for Lead-Free Solder
J. Electron. Packag. March 2006, 128(1): 71–81.
doi: https://doi.org/10.1115/1.2160514
Topics:
Creep
,
Damage
,
Shear (Mechanics)
,
Stress
,
Temperature
,
Solders
,
Lead-free solders
Cooling Performance of Using a Confined Slot Jet Impinging onto Heated Heat Sinks
J. Electron. Packag. March 2006, 128(1): 82–91.
doi: https://doi.org/10.1115/1.2161426
Topics:
Cooling
,
Heat sinks
,
Heat transfer
,
Reynolds number
,
Steady state
,
Transients (Dynamics)
,
Nozzles
,
Composite materials
,
Temperature distribution
Research Papers
Experimental Measurements of the Flow and Heat Transfer of a Square Jet Impinging on an Array of Square Pin Fins
J. Electron. Packag. March 2006, 128(1): 61–70.
doi: https://doi.org/10.1115/1.2160513
Topics:
Flow (Dynamics)
,
Heat sinks
,
Heat transfer
,
Pressure
,
Clearances (Engineering)
,
Uncertainty
Technical Brief
A Numerical Study of Transport in a Thermal Interface Material Enhanced With Carbon Nanotubes
J. Electron. Packag. March 2006, 128(1): 92–97.
doi: https://doi.org/10.1115/1.2161231
Topics:
Carbon nanotubes
,
Nanotubes
,
Temperature
,
Thermal conductivity
,
Thermal management
Erratum
Erratum: “Solder Joint Shape Prediction Using a Modified Perzyna Viscoplastic Model” [Journal of Electronic Packaging, 2005, 127(3), pp. 290–298]
J. Electron. Packag. March 2006, 128(1): 98.
doi: https://doi.org/10.1115/1.2165648
Topics:
Electronic packaging
,
Shapes
,
Solder joints
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Sequential Versus Concurrent Effects in Combined Stress Solder Joint Reliability
J. Electron. Packag
Anand Model Constants of Sn-Ag-Cu Solders: What Do They Actually Mean?
J. Electron. Packag