This paper introduces a general computational model for electronic packages, e.g., cabinets that contain electronic equipment. A simplified physical model, which combines principles of classical thermodynamics and heat transfer, is developed and the resulting three-dimensional differential equations are discretized in space using a three-dimensional cell centered finite volume scheme. Therefore, the combination of the proposed simplified physical model with the adopted finite volume scheme for the numerical discretization of the differential equations is called a volume element model (VEM). A typical cabinet was built in the laboratory, and two different experimental conditions were tested, measuring the temperatures at forty-six internal points. The proposed model was utilized to simulate numerically the behavior of the cabinet operating under the same experimental conditions. Mesh refinements were conducted to ensure the convergence of the numerical results. The converged mesh was relatively coarse (504 cells), therefore the solutions were obtained with low computational time. The model temperature results were directly compared to the steady-state experimental measurements of the forty-six internal points, with good quantitative and qualitative agreement. Since accuracy and low computational time are combined, the model is shown to be efficient and could be used as a tool for simulation, design, and optimization of electronic packages.
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September 2001
Technical Papers
A Numerical Model to Predict the Thermal and Psychrometric Response of Electronic Packages
J. V. C. Vargas,
J. V. C. Vargas
United Technologies Research Center Systems, Systems Analysis, 411 Silver Lane, MS 129-15 East Hartford, CT 06108;
Department of Mechanical Engineering & Materials Science, Duke University, Durham, NC 27708-0300
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G. Stanescu,
G. Stanescu
United Technologies Research Center Systems, Systems Analysis, 411 Silver Lane, MS 129-15 East Hartford, CT 06108;
Department of Mechanical Engineering & Materials Science, Duke University, Durham, NC 27708-0300
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R. Florea,
R. Florea
United Technologies Research Center Systems, Systems Analysis, 411 Silver Lane, MS 129-15 East Hartford, CT 06108;
Department of Mechanical Engineering & Materials Science, Duke University, Durham, NC 27708-0300
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M. C. Campos
M. C. Campos
Department of Mechanical Engineering, Universidade Federal do Parana´, Curitiba, PR 81531-990 Brazil
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J. V. C. Vargas
United Technologies Research Center Systems, Systems Analysis, 411 Silver Lane, MS 129-15 East Hartford, CT 06108;
Department of Mechanical Engineering & Materials Science, Duke University, Durham, NC 27708-0300
G. Stanescu
United Technologies Research Center Systems, Systems Analysis, 411 Silver Lane, MS 129-15 East Hartford, CT 06108;
Department of Mechanical Engineering & Materials Science, Duke University, Durham, NC 27708-0300
R. Florea
United Technologies Research Center Systems, Systems Analysis, 411 Silver Lane, MS 129-15 East Hartford, CT 06108;
Department of Mechanical Engineering & Materials Science, Duke University, Durham, NC 27708-0300
M. C. Campos
Department of Mechanical Engineering, Universidade Federal do Parana´, Curitiba, PR 81531-990 Brazil
Contributed by the Electrical and Electronic Packaging Division for publication in the JOURNAL OF ELECTRONIC PACKAGING. Manuscript received by the EEPD September 3, 1999. Associate Editor: R. Wirtz.
J. Electron. Packag. Sep 2001, 123(3): 200-210 (11 pages)
Published Online: September 3, 1999
Article history
Received:
September 3, 1999
Citation
Vargas , J. V. C., Stanescu , G., Florea, R., and Campos, M. C. (September 3, 1999). "A Numerical Model to Predict the Thermal and Psychrometric Response of Electronic Packages ." ASME. J. Electron. Packag. September 2001; 123(3): 200–210. https://doi.org/10.1115/1.1348337
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