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Proc. ASME. PVP2020, Volume 6: Materials and Fabrication, V006T06A013, August 3, 2020
Paper No: PVP2020-21579
... layout is optimized for detecting both crack initiation and growth using a direct-current (d-c) electric potential (EP) technique. The approach to the flaw design and layout used finite element analysis (FEA) modeling and consisted of optimizing K-profiles. First, the K-profiles were optimized...