Electronic components in downhole oil drilling and gas industry applications, automotive and avionics may exposed to high temperatures (> 150°C) and high strain rates (1–100 per sec) during storage, operation and handling which can contribute to the failures of electronics devices. Temperatures in these applications can exceed 200°C, which is closed to melting point for SAC alloys. The microstructure for lead free solder alloys constantly evolves when subjected to thermal aging for sustained periods with accompanying degradation in mechanical properties of solder alloys. In this paper, evolution of microstructure and Anand parameters for unaged and aged SAC (SAC105 and SAC-Q) lead free solder alloys at high strain rates has been investigated induced due to thermal aging. The microstructure of the SAC solder is studied using scanning electron microscopy (SEM) for different strain rate and elevating temperature. The thermal aged leadfree SAC solder alloys specimen has been tested at high strain rates (10–75 per sec) at elevated temperatures of (25°C–200°C). The SAC leadfree solder samples were subjected to isothermal aging at 50°C up to 1-year before testing. To describe the material constitutive behavior, Anand Viscoplastic model has been used. Effect of thermal aging on Anand parameters has been investigated. In order to verify the accuracy of the model, the computed Anand parameters have been used to simulate the uniaxial tensile test. FEA based method has been used to simulate the drop events using Anand constitutive model. Hysteresis loop and Plastic work density has been computed from FEA.

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