This research proposes a comparison off-axis digital holographic technology for thickness uniformity inspection of transparent products. Compared to existing technologies, the comparison off-axis digital holographic method has advantages such as high depth resolution and large field of view. Also, the proposed method can measure the thickness differences between standard product and the ones produced by one shot imaging with tilt correction. Comparative analysis is used to demonstrate the effectiveness.
- Information Storage and Processing Systems Division
Thickness Uniformity Inspection With Comparison Off-Axis Digital Holography
- Views Icon Views
- Share Icon Share
- Search Site
Jin, J, Jeon, S, Cho, J, & Park, N. "Thickness Uniformity Inspection With Comparison Off-Axis Digital Holography." Proceedings of the ASME 2016 Conference on Information Storage and Processing Systems. ASME 2016 Conference on Information Storage and Processing Systems. Santa Clara, California, USA. June 20–21, 2016. V001T09A001. ASME. https://doi.org/10.1115/ISPS2016-9544
Download citation file: