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Keywords: AFM tip(atomic force microscope tip)
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Proceedings Papers

Structural Modification of Carbon Nanotube Tip Using Focused Ion Beam

C. S. Han, Y. H. Yoon, Y. H. Shin, J. W. Song
Proc. ASME. IMECE2006, Microelectromechanical Systems, 547-550, November 5–10, 2006
Paper No: IMECE2006-15545
https://doi.org/10.1115/IMECE2006-15545
... (dielectrophorises) FIB (focus ion beam) AFM tip(atomic force microscope tip) Martel R. , Schmidt T. , Shea H. R. , Hertel T. , and Avouris P. : Appl. Phys. Lett. , 73 , ( 1998 ) 2447 2447 . Stevens R. M. , Frederick N. A. , Smith B. L. , Morse D. E. , Stucky...
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Topics: Atomic force microscopy, Carbon nanotubes, Focused ion beams