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1-20 of 32
12th Design for Manufacturing and the Life Cycle Conference
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Proceedings Papers
Proc. ASME. IDETC-CIE2007, Volume 4: ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications and the 19th Reliability, Stress Analysis, and Failure Prevention Conference, 761-765, September 4–7, 2007
Paper No: DETC2007-34142
Topics:
Algorithms
Proceedings Papers
Proc. ASME. IDETC-CIE2007, Volume 4: ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications and the 19th Reliability, Stress Analysis, and Failure Prevention Conference, 953-961, September 4–7, 2007
Paper No: DETC2007-35671
Proceedings Papers
Proc. ASME. IDETC-CIE2007, Volume 4: ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications and the 19th Reliability, Stress Analysis, and Failure Prevention Conference, 851-859, September 4–7, 2007
Paper No: DETC2007-34255
Proceedings Papers
Proc. ASME. IDETC-CIE2007, Volume 4: ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications and the 19th Reliability, Stress Analysis, and Failure Prevention Conference, 969-979, September 4–7, 2007
Paper No: DETC2007-35848
Topics:
Design
Proceedings Papers
Proc. ASME. IDETC-CIE2007, Volume 4: ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications and the 19th Reliability, Stress Analysis, and Failure Prevention Conference, 963-968, September 4–7, 2007
Paper No: DETC2007-35841
Proceedings Papers
Proc. ASME. IDETC-CIE2007, Volume 4: ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications and the 19th Reliability, Stress Analysis, and Failure Prevention Conference, 981-988, September 4–7, 2007
Paper No: DETC2007-35881
Proceedings Papers
Proc. ASME. IDETC-CIE2007, Volume 4: ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications and the 19th Reliability, Stress Analysis, and Failure Prevention Conference, 989-997, September 4–7, 2007
Paper No: DETC2007-34146
Proceedings Papers
Proc. ASME. IDETC-CIE2007, Volume 4: ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications and the 19th Reliability, Stress Analysis, and Failure Prevention Conference, 999-1006, September 4–7, 2007
Paper No: DETC2007-34251
Proceedings Papers
Proc. ASME. IDETC-CIE2007, Volume 4: ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications and the 19th Reliability, Stress Analysis, and Failure Prevention Conference, 861-870, September 4–7, 2007
Paper No: DETC2007-34310
Proceedings Papers
Proc. ASME. IDETC-CIE2007, Volume 4: ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications and the 19th Reliability, Stress Analysis, and Failure Prevention Conference, 767-772, September 4–7, 2007
Paper No: DETC2007-34152
Proceedings Papers
Proc. ASME. IDETC-CIE2007, Volume 4: ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications and the 19th Reliability, Stress Analysis, and Failure Prevention Conference, 871-879, September 4–7, 2007
Paper No: DETC2007-34764
Proceedings Papers
Proc. ASME. IDETC-CIE2007, Volume 4: ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications and the 19th Reliability, Stress Analysis, and Failure Prevention Conference, 1007-1016, September 4–7, 2007
Paper No: DETC2007-34694
Proceedings Papers
Proc. ASME. IDETC-CIE2007, Volume 4: ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications and the 19th Reliability, Stress Analysis, and Failure Prevention Conference, 773-778, September 4–7, 2007
Paper No: DETC2007-34258
Proceedings Papers
Proc. ASME. IDETC-CIE2007, Volume 4: ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications and the 19th Reliability, Stress Analysis, and Failure Prevention Conference, 881-889, September 4–7, 2007
Paper No: DETC2007-35322
Proceedings Papers
Zuozhi Zhao, Michelle Bezdecny, Byungwoo Lee, Yanyan Wu, Dean Robinson, Mark Slagle, Duke Coleman, John Barnes, Steve Walls, Lowell Bauer
Proc. ASME. IDETC-CIE2007, Volume 4: ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications and the 19th Reliability, Stress Analysis, and Failure Prevention Conference, 891-900, September 4–7, 2007
Paper No: DETC2007-35688
Proceedings Papers
Proc. ASME. IDETC-CIE2007, Volume 4: ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications and the 19th Reliability, Stress Analysis, and Failure Prevention Conference, 779-790, September 4–7, 2007
Paper No: DETC2007-35080
Proceedings Papers
Proc. ASME. IDETC-CIE2007, Volume 4: ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications and the 19th Reliability, Stress Analysis, and Failure Prevention Conference, 901-911, September 4–7, 2007
Paper No: DETC2007-34282
Proceedings Papers
Proc. ASME. IDETC-CIE2007, Volume 4: ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications and the 19th Reliability, Stress Analysis, and Failure Prevention Conference, 791-805, September 4–7, 2007
Paper No: DETC2007-35120
Proceedings Papers
Proc. ASME. IDETC-CIE2007, Volume 4: ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications and the 19th Reliability, Stress Analysis, and Failure Prevention Conference, 1017-1027, September 4–7, 2007
Paper No: DETC2007-34804
Proceedings Papers
Proc. ASME. IDETC-CIE2007, Volume 4: ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications and the 19th Reliability, Stress Analysis, and Failure Prevention Conference, 913-918, September 4–7, 2007
Paper No: DETC2007-34586