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Proceedings Papers

Characterization and Design of Functional Quasi-Random Nanostructured Materials Using Spectral Density Function

Shuangcheng Yu, Yichi Zhang, Chen Wang, Won-kyu Lee, Biqin Dong, Teri W. Odom, Cheng Sun, Wei Chen
Proc. ASME. IDETC-CIE2016, Volume 2B: 42nd Design Automation Conference, V02BT03A012, August 21–24, 2016
Paper No: DETC2016-60118
DOI: https://doi.org/10.1115/DETC2016-60118
View Paper titled, Characterization and Design of Functional Quasi-Random Nanostructured Materials Using Spectral Density Function
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Topics: Design, Nanomaterials, Spectral energy distribution, Design methodology, Manufacturing, Nanomanufacturing, Nanostructures , Optimization, Particulate matter, Thin films
Proceedings Papers

Integrating CAD and Nano-Indentation for Complex Lithography

Kangmin Xu, Seung-Cheol Yang, Xiaoping Qian
Proc. ASME. IDETC-CIE2012, Volume 2: 32nd Computers and Information in Engineering Conference, Parts A and B, 439-447, August 12–15, 2012
Paper No: DETC2012-71548
DOI: https://doi.org/10.1115/DETC2012-71548
View Paper titled, Integrating CAD and Nano-Indentation for Complex Lithography
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Topics: Computer-aided design, Lithography, Nanoindentation, Atomic force microscopy, Geometry, B-splines, Computer software, Design, Machining, Nanolithography
Proceedings Papers

Enabling Soft Lithography Using an Atomic Force Microscope

Matthew S. Johannes, Daniel G. Cole, Robert L. Clark
Proc. ASME. IDETC-CIE2008, Volume 4: 20th International Conference on Design Theory and Methodology; Second International Conference on Micro- and Nanosystems, 749-757, August 3–6, 2008
Paper No: DETC2008-49877
DOI: https://doi.org/10.1115/DETC2008-49877
View Paper titled, Enabling Soft Lithography Using an Atomic Force Microscope
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Topics: Atomic force microscopy, Lithography, Nanoscale phenomena, Anisotropy, Design, Etching, Molding, Nanolithography, Nanostructures , Silicon
Proceedings Papers

The Atomic Force Microscope as a Nanoscale Stereo Lithography Machine

Matthew S. Johannes, Daniel G. Cole, Robert L. Clark
Proc. ASME. IDETC-CIE2007, Volume 3: 19th International Conference on Design Theory and Methodology; 1st International Conference on Micro- and Nanosystems; and 9th International Conference on Advanced Vehicle Tire Technologies, Parts A and B, 793-799, September 4–7, 2007
Paper No: DETC2007-35348
DOI: https://doi.org/10.1115/DETC2007-35348
View Paper titled, The Atomic Force Microscope as a Nanoscale Stereo Lithography Machine
Open the PDF for The Atomic Force Microscope as a Nanoscale Stereo Lithography Machine in another window
Topics: Atomic force microscopy, Lithography, Machinery, Nanoscale phenomena, Computer-aided design, Nanolithography, Manufacturing, Nanostructures , Silicon, Three-dimensional modeling