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Proceedings Papers

Multiple Harmonic Lissajous Scanning Patterns for Endomicroscopy With Parametrically-Resonant Micro-Mirrors

Nicholas Chan, Miki Lee, Haijun Lee, Thomas D. Wang, Kenn R. Oldham
Proc. ASME. IDETC-CIE2021, Volume 11: 15th International Conference on Micro- and Nanosystems (MNS), V011T11A011, August 17–19, 2021
Paper No: DETC2021-71280
DOI: https://doi.org/10.1115/DETC2021-71280
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Topics: Microelectromechanical systems, Mirrors, Resonance, Simulation, Oscillations, Density, Imaging, Waves, Dynamics (Mechanics), Endoscopic devices
Proceedings Papers

Augmented Microscopy for DNA Damage Quantification: A Machine Learning Tool for Environmental, Medical and Health Sciences

Michele Bernardini, Alessandro Ferri, Lucia Migliorelli, Sara Moccia, Luca Romeo, Sonia Silvestri, Luca Tiano, Adriano Mancini
Proc. ASME. IDETC-CIE2019, Volume 9: 15th IEEE/ASME International Conference on Mechatronic and Embedded Systems and Applications, V009T12A003, August 18–21, 2019
Paper No: DETC2019-97902
DOI: https://doi.org/10.1115/DETC2019-97902
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Topics: Biomedicine, Damage, DNA, Machine learning, Microscopy, Computation
Proceedings Papers

Integrative Design, Build, Test Approach for Biomedical Devices With Lattice Structures

Paul F. Egan, Isabella Bauer, Kristina Shea, Stephen J. Ferguson
Proc. ASME. IDETC-CIE2018, Volume 7: 30th International Conference on Design Theory and Methodology, V007T06A042, August 26–29, 2018
Paper No: DETC2018-85355
DOI: https://doi.org/10.1115/DETC2018-85355
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Topics: Biomedicine, Design, Bone, Porosity, Rapid prototyping, Additive manufacturing, Compression, Dimensions, Elastic moduli, Engineering prototypes
Proceedings Papers

Electrical Impedance Matching of PZT NanoGenerators

Richard Galos, Yong Shi, Zhongjing Ren, Hao Sun
Proc. ASME. IDETC-CIE2017, Volume 4: 22nd Design for Manufacturing and the Life Cycle Conference; 11th International Conference on Micro- and Nanosystems, V004T09A025, August 6–9, 2017
Paper No: DETC2017-67981
DOI: https://doi.org/10.1115/DETC2017-67981
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Topics: Impedance (Electricity), Nanofibers, Atomic force microscopy, Electrospinning, Microscopy, Microwaves, Nanosensors, Stress
Proceedings Papers

Electrical Impedance Measurements of PZT Nanofiber Sensors

Richard Galos, Xin Li
Proc. ASME. IDETC-CIE2016, Volume 4: 21st Design for Manufacturing and the Life Cycle Conference; 10th International Conference on Micro- and Nanosystems, V004T08A004, August 21–24, 2016
Paper No: DETC2016-59687
DOI: https://doi.org/10.1115/DETC2016-59687
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Topics: Impedance (Electricity), Nanofibers, Sensors, Atomic force microscopy, Electrical resistivity, Electrospinning, Materials properties, Microfabrication, Microscopy, Nanosensors
Proceedings Papers

Dynamics of Thin-Film Piezoelectric Vertical-Rotational Scanning Actuator

Choong-Ho Rhee, Zhen Qiu, Jongsoo Choi, Thomas D. Wang, Kenn R. Oldham
Proc. ASME. IDETC-CIE2015, Volume 4: 20th Design for Manufacturing and the Life Cycle Conference; 9th International Conference on Micro- and Nanosystems, V004T09A026, August 2–5, 2015
Paper No: DETC2015-47169
DOI: https://doi.org/10.1115/DETC2015-47169
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Topics: Actuators, Dynamics (Mechanics), Thin films, Mirrors, Resonance, Displacement, Imaging, Microactuators, Microscopy, Photons
Proceedings Papers

Polymeric Micro-Filter Fabrication Using a Micro Injection Moulding Process

Rossella Surace, Vincenzo Bellantone, Irene Fassi
Proc. ASME. IDETC-CIE2015, Volume 4: 20th Design for Manufacturing and the Life Cycle Conference; 9th International Conference on Micro- and Nanosystems, V004T09A029, August 2–5, 2015
Paper No: DETC2015-47615
DOI: https://doi.org/10.1115/DETC2015-47615
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Topics: Filters, Injection molding, Manufacturing, Electrical discharge machining, Polymers, Pressure, Temperature, Cavities, Cooling, Filtration
Proceedings Papers

An Experimental Investigation of the Dynamic Behavior of an In-Plane MEMS Shallow Arch Under Electrostatic Excitation

Abdallah Ramini, Abdullah Hafiz, Mohammed L. F. Bellaredj, Qais M. Al Hennawi, Mohammad I. Younis
Proc. ASME. IDETC-CIE2015, Volume 4: 20th Design for Manufacturing and the Life Cycle Conference; 9th International Conference on Micro- and Nanosystems, V004T09A011, August 2–5, 2015
Paper No: DETC2015-47070
DOI: https://doi.org/10.1115/DETC2015-47070
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Topics: Arches, Excitation, Microelectromechanical systems, Dynamics (Mechanics), Imaging, Microscopy, Nonlinear dynamics, Resonance, Stress
Proceedings Papers

Orderly Perforation of Polyester Films by Excimer Laser

Wenqi Li, Erol Sancaktar
Proc. ASME. IDETC-CIE2015, Volume 4: 20th Design for Manufacturing and the Life Cycle Conference; 9th International Conference on Micro- and Nanosystems, V004T09A030, August 2–5, 2015
Paper No: DETC2015-47731
DOI: https://doi.org/10.1115/DETC2015-47731
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Topics: Excimer lasers, Polyester film, Lasers, Corners (Structural elements), Fluence (Radiation measurement), Heat, Microscopy, Ablation (Vaporization technology), Film thickness, Geometry
Proceedings Papers

Automated Cell Segmentation Method for Extracting Cell Information From Phase Contrast Microscopy of a Microfluidic Device

Masoud Khabiry, Nader Jalili
Proc. ASME. IDETC-CIE2015, Volume 3: 17th International Conference on Advanced Vehicle Technologies; 12th International Conference on Design Education; 8th Frontiers in Biomedical Devices, V003T14A010, August 2–5, 2015
Paper No: DETC2015-47451
DOI: https://doi.org/10.1115/DETC2015-47451
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Topics: Image segmentation, Microfluidics, Phase contrast microscopes, Flow (Dynamics), Image processing, Imaging, Microscopy, Shear stress
Proceedings Papers

Numerical Modeling of Pit Growth in Microstructure

Virginia G. DeGiorgi, Nithyanand Kota, Alexis C. Lewis, Siddiq M. Qidwai
Proc. ASME. IDETC-CIE2013, Volume 2A: 33rd Computers and Information in Engineering Conference, V02AT02A001, August 4–7, 2013
Paper No: DETC2013-12074
DOI: https://doi.org/10.1115/DETC2013-12074
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Topics: Computer simulation, Corrosion, Electrolytes, Shapes, Crystal structure, Current density, Electric potential, Finite element model, Fluctuations (Physics), Interpolation
Proceedings Papers

Modeling and Simulation of a Parametrically-Excited Micro-Mirror With Duty-Cycled Square-Wave Excitation

Wajiha Shahid, Zhen Qiu, Xiyu Duan, Haijun Li, Thomas D. Wang, Kenn R. Oldham
Proc. ASME. IDETC-CIE2013, Volume 1: 15th International Conference on Advanced Vehicle Technologies; 10th International Conference on Design Education; 7th International Conference on Micro- and Nanosystems, V001T09A012, August 4–7, 2013
Paper No: DETC2013-13036
DOI: https://doi.org/10.1115/DETC2013-13036
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Topics: Excitation, Mirrors, Modeling, Simulation, Waves, Stability, Approximation, Biomedical imaging, Capacitance, Cycles
Proceedings Papers

Investigation of Protein/Lipid Interactions via Scanning Probe Acceleration Microscopy: Theory and Experiment

Justin Legleiter, Kathleen A. Burke, Elizabeth A. Yates
Proc. ASME. IDETC-CIE2012, Volume 5: 6th International Conference on Micro- and Nanosystems; 17th Design for Manufacturing and the Life Cycle Conference, 297-302, August 12–15, 2012
Paper No: DETC2012-70228
DOI: https://doi.org/10.1115/DETC2012-70228
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Topics: Microscopy, Probes, Proteins, Atomic force microscopy, Membranes, Surface roughness, Adhesion, Diseases, Elasticity, Mechanical properties
Proceedings Papers

Correlation of Atomic Force Microscopy Tapping Forces to Mechanical Properties of Lipid Membranes

Nicole Shamitko-Klingensmith, Kelley M. Wambaugh, Kathleen A. Burke, George J. Magnone, Justin Legleiter
Proc. ASME. IDETC-CIE2012, Volume 5: 6th International Conference on Micro- and Nanosystems; 17th Design for Manufacturing and the Life Cycle Conference, 303-310, August 12–15, 2012
Paper No: DETC2012-70233
DOI: https://doi.org/10.1115/DETC2012-70233
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Topics: Atomic force microscopy, Mechanical properties, Membranes, Cantilevers, Deflection, Imaging, Microscopy, Nanoscale phenomena, Physiology, Probes
Proceedings Papers

Non-Linear Frequency Response of Atomic Force Microscope Cantilevers at the Solid-Liquid Interface

Daniel R. Kiracofe, Arvind Raman
Proc. ASME. IDETC-CIE2012, Volume 5: 6th International Conference on Micro- and Nanosystems; 17th Design for Manufacturing and the Life Cycle Conference, 319-328, August 12–15, 2012
Paper No: DETC2012-70330
DOI: https://doi.org/10.1115/DETC2012-70330
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Topics: Atomic force microscopy, Cantilevers, Frequency response, Dynamics (Mechanics), Q-factor, Resonance, Computer simulation, Microcantilevers, Microscopy, Nonlinear dynamics
Proceedings Papers

High Resolution Microscopy of SiO 2 and the Structure of SiO 2 -Supported Graphene

Kristen M. Burson, Mahito Yamamoto, William G. Cullen
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 551-555, August 28–31, 2011
Paper No: DETC2011-48737
DOI: https://doi.org/10.1115/DETC2011-48737
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Topics: Graphene, Microscopy, Resolution (Optics), Atomic force microscopy, Surface roughness, Adhesion, Energetics, Chemical properties, Density, Elasticity
Proceedings Papers

A Comprehensive Modeling of Piezoresistive Microcantilever Sensors Used in Piezoactive Materials Characterization

Samira Faegh, Nader Jalili
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 535-542, August 28–31, 2011
Paper No: DETC2011-47985
DOI: https://doi.org/10.1115/DETC2011-47985
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Topics: Materials characterization, Modeling, Sensors, Cantilevers, Excitation, Computer simulation, Deflection, Dynamics (Mechanics), Lasers, Microcantilevers
Proceedings Papers

Singular Loss of Stability Due to Hysteretic Capillary Forces in Atomic Force Microscopy

Michael Katzenbach, Harry Dankowicz
Proc. ASME. IDETC-CIE2010, Volume 4: 12th International Conference on Advanced Vehicle and Tire Technologies; 4th International Conference on Micro- and Nanosystems, 489-497, August 15–18, 2010
Paper No: DETC2010-28686
DOI: https://doi.org/10.1115/DETC2010-28686
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Topics: Atomic force microscopy, Stability, Cantilevers, Equilibrium (Physics), Theoretical analysis, Bifurcation, Computer simulation, Dynamic systems, Fluids, Fundamental forces (Physics)
Proceedings Papers

Multifrequency Approaches in Characterization of Materials With Single-Pass Kelvin Force Microscopy

Sergei Magonov, John D. Alexander
Proc. ASME. IDETC-CIE2010, Volume 4: 12th International Conference on Advanced Vehicle and Tire Technologies; 4th International Conference on Micro- and Nanosystems, 533-540, August 15–18, 2010
Paper No: DETC2010-29225
DOI: https://doi.org/10.1115/DETC2010-29225
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Topics: Materials characterization, Microscopy, Resolution (Optics), Resonance, Atomic force microscopy, Imaging, Probes, Dipole moments, Metals, Semiconductors (Materials)
Proceedings Papers

Stiffness and Mass Detection of Nano Layers Using Piezoresponse Force Microscopy

Saeid Bashash, Amin Salehi-Khojin, Nader Jalili, Gary Lee Thompson, Alexey Vertegel, Maren Mu¨ller, Rudieger Berger
Proc. ASME. IDETC-CIE2009, Volume 6: ASME Power Transmission and Gearing Conference; 3rd International Conference on Micro- and Nanosystems; 11th International Conference on Advanced Vehicle and Tire Technologies, 717-723, August 30–September 2, 2009
Paper No: DETC2009-86892
DOI: https://doi.org/10.1115/DETC2009-86892
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Topics: Microscopy, Stiffness, Resonance, Cantilevers, Microcantilevers, Atomic force microscopy, Excitation, Focused ion beams, Modal analysis, Sensors