1-2 of 2
Metric system
Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Proceedings Papers

Proc. ASME. IDETC-CIE2008, Volume 4: 20th International Conference on Design Theory and Methodology; Second International Conference on Micro- and Nanosystems, 765-774, August 3–6, 2008
Paper No: DETC2008-49931
Proceedings Papers

Proc. ASME. IDETC-CIE2007, Volume 6: 33rd Design Automation Conference, Parts A and B, 601-610, September 4–7, 2007
Paper No: DETC2007-35133