This paper deals with sensitivity of electrostatically actuated Bio-MEMS/NEMS resonator sensors near half natural frequency for mass detection for applications in medicine and biology. Electrostatic force along with fringe correction and Casimir effect are included in the model. They introduce parametric nonlinear terms in the system. The partial-differential equation of motion of the system is solved by using the method of multiple scales. A direct approach of the problem is then used. Two approximation problems resulting from the direct approach are solved. The phase-amplitude relationship is obtained. Numerical results for uniform electrostatically actuated micro resonator sensors are provided. An additional mass consisting of a film with a thickness of 100 nm (virus size), and a density of 0.43 of the density of the microsensor, has been added to the sensor. The additional mass shifted the amplitude-frequency curve of the sensor to lower frequencies.
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ASME 2010 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
August 15–18, 2010
Montreal, Quebec, Canada
Conference Sponsors:
- Design Engineering Division and Computers in Engineering Division
ISBN:
978-0-7918-4412-0
PROCEEDINGS PAPER
On MEMS/NEMS Biosensor Sensitivity Near Half Natural Frequency
Dumitru I. Caruntu,
Dumitru I. Caruntu
University of Texas Pan American, Edinburg, TX
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Martin Knecht
Martin Knecht
University of Texas Pan American, Edinburg, TX
Search for other works by this author on:
Dumitru I. Caruntu
University of Texas Pan American, Edinburg, TX
Martin Knecht
University of Texas Pan American, Edinburg, TX
Paper No:
DETC2010-28612, pp. 439-445; 7 pages
Published Online:
March 8, 2011
Citation
Caruntu, DI, & Knecht, M. "On MEMS/NEMS Biosensor Sensitivity Near Half Natural Frequency." Proceedings of the ASME 2010 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. Volume 4: 12th International Conference on Advanced Vehicle and Tire Technologies; 4th International Conference on Micro- and Nanosystems. Montreal, Quebec, Canada. August 15–18, 2010. pp. 439-445. ASME. https://doi.org/10.1115/DETC2010-28612
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