This paper introduces a virtual reality-based approach for the systematic testing of intelligent mechatronic systems. The method of systematic testing is a model-based and formal testing method for the verification of the information processing of mechatronic systems. Systematic testing emerges from the field of embedded systems where it is used to evaluate the embedded electric circuits especially the discrete controllers, which are represented by these circuits. The challenge in the field of mechatronic is to evaluate and to understand the test results itself, in particular, the relations between the continuous behavior of the system, the reactions of controller, and the test inputs. Virtual reality facilitates the analysis of systematic tests by the combination of virtual 3D models and visualization techniques. The 3D models show the behavior of the system, visualizations explain the abstract test data. The paper explains the use of VR for the systematic testing, the created visualizations techniques and their benefit with an application example.
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ASME 2010 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
August 15–18, 2010
Montreal, Quebec, Canada
Conference Sponsors:
- Design Engineering Division and Computers in Engineering Division
ISBN:
978-0-7918-4411-3
PROCEEDINGS PAPER
Systematic Testing of Intelligent Mechatronic Systems in a Virtual Environment
Rafael Radkowski,
Rafael Radkowski
University of Paderborn, Paderborn, Germany
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Alexander Krupp
Alexander Krupp
C-Lab, Paderborn, Germany
Search for other works by this author on:
Rafael Radkowski
University of Paderborn, Paderborn, Germany
Alexander Krupp
C-Lab, Paderborn, Germany
Paper No:
DETC2010-28845, pp. 1391-1400; 10 pages
Published Online:
March 8, 2011
Citation
Radkowski, R, & Krupp, A. "Systematic Testing of Intelligent Mechatronic Systems in a Virtual Environment." Proceedings of the ASME 2010 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. Volume 3: 30th Computers and Information in Engineering Conference, Parts A and B. Montreal, Quebec, Canada. August 15–18, 2010. pp. 1391-1400. ASME. https://doi.org/10.1115/DETC2010-28845
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