In this paper we present a lithographic process with the ability to automatically translate and arbitrarily position three-dimensional (3D) computer-generated patterns through the use of phase holograms. This method, dynamic maskless holographic lithography (DMHL), advances current photo-directed patterning and functionalization capabilities by expanding the capability to manipulate light in real-time without the use of expensive fixed masks. The system could be used for large-scale parallel manufacturing over larger areas and for point specific serial fabrication, interrogation, and metrology. The use of coherent illumination allows for the direct creation of 3D patterns of light for lithography as opposed to the mechanical stage, layer-by-layer 3D fabrication approach typical of direct-write systems. Extrinsic control over interfacial properties will provide a method for addressing aqueous phase bionanotechnolgy experimental systems in which detection, separation, transport, and handling are vital.
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ASME 2008 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
August 3–6, 2008
Brooklyn, New York, USA
Conference Sponsors:
- Design Engineering Division and Computers in Engineering Division
ISBN:
978-0-7918-4328-4
PROCEEDINGS PAPER
Three-Dimensional Holographic Lithography Using a Spatial Light Modulator
Nathan J. Jenness,
Nathan J. Jenness
Duke University, Durham, NC
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Daniel G. Cole,
Daniel G. Cole
University of Pittsburgh, Pittsburgh, PA
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Robert L. Clark
Robert L. Clark
Duke University, Durham, NC
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Nathan J. Jenness
Duke University, Durham, NC
Daniel G. Cole
University of Pittsburgh, Pittsburgh, PA
Robert L. Clark
Duke University, Durham, NC
Paper No:
DETC2008-50067, pp. 783-787; 5 pages
Published Online:
July 13, 2009
Citation
Jenness, NJ, Cole, DG, & Clark, RL. "Three-Dimensional Holographic Lithography Using a Spatial Light Modulator." Proceedings of the ASME 2008 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. Volume 4: 20th International Conference on Design Theory and Methodology; Second International Conference on Micro- and Nanosystems. Brooklyn, New York, USA. August 3–6, 2008. pp. 783-787. ASME. https://doi.org/10.1115/DETC2008-50067
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