Stress and Strength Interference Theory (SSIT) is a fundamental theory for reliability assessment. It has been widely used as a foundation for design-for-reliability (DFR). However, SSIT and associated methodology and tools, that require detailed definitions of constructional and form structure, are only applicable to an embodiment design. As many researchers have attempted to push DFR upfront to a conceptual and functional design stage, SSIT loses its usefulness, while other equivalent theory and tools for conceptual and functional design-for-reliability do not exist. Therefore, DFR for conceptual and function design becomes ad-hoc that lacks a systematic approach and parametric reliability quantification. In this paper, we first review the literature on stress and strength interference, and then extend the concepts of stress and strength to conceptual stress and conceptual strength that are relevant to conceptual and functional designs. Based on the conceptual stress and conceptual strength, we introduce a Conceptual Stress and Conceptual Strength Interference Theory (CSCSIT) and discuss how it can be applied to support conceptual and function design-for-reliability. We illustrate our theoretical work with a conceptual and function design example. We conclude the paper with a discussion of the future research to further define and substantiate the CSCSIT work.
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ASME 2008 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
August 3–6, 2008
Brooklyn, New York, USA
Conference Sponsors:
- Design Engineering Division and Computers in Engineering Division
ISBN:
978-0-7918-4328-4
PROCEEDINGS PAPER
Conceptual Stress and Conceptual Strength for Functional Design-for-Reliability
Zhaofeng Huang,
Zhaofeng Huang
University of Southern California, Los Angeles, CA
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Yan Jin
Yan Jin
University of Southern California, Los Angeles, CA
Search for other works by this author on:
Zhaofeng Huang
University of Southern California, Los Angeles, CA
Yan Jin
University of Southern California, Los Angeles, CA
Paper No:
DETC2008-49347, pp. 437-447; 11 pages
Published Online:
July 13, 2009
Citation
Huang, Z, & Jin, Y. "Conceptual Stress and Conceptual Strength for Functional Design-for-Reliability." Proceedings of the ASME 2008 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. Volume 4: 20th International Conference on Design Theory and Methodology; Second International Conference on Micro- and Nanosystems. Brooklyn, New York, USA. August 3–6, 2008. pp. 437-447. ASME. https://doi.org/10.1115/DETC2008-49347
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