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Proceedings Papers

Volume 3: 30th Computers and Information in Engineering Conference, Parts A and B

30th Computers and Information in Engineering Conference

Advanced Modeling and Simulation

IDETC-CIE 2010; 3-10doi:https://doi.org/10.1115/DETC2010-28087
IDETC-CIE 2010; 11-17doi:https://doi.org/10.1115/DETC2010-28088
IDETC-CIE 2010; 19-28doi:https://doi.org/10.1115/DETC2010-28089
IDETC-CIE 2010; 29-36doi:https://doi.org/10.1115/DETC2010-28121
IDETC-CIE 2010; 37-50doi:https://doi.org/10.1115/DETC2010-28495
IDETC-CIE 2010; 51-61doi:https://doi.org/10.1115/DETC2010-28526
IDETC-CIE 2010; 63-72doi:https://doi.org/10.1115/DETC2010-28545
IDETC-CIE 2010; 73-79doi:https://doi.org/10.1115/DETC2010-28583
IDETC-CIE 2010; 81-90doi:https://doi.org/10.1115/DETC2010-28664
IDETC-CIE 2010; 91-99doi:https://doi.org/10.1115/DETC2010-28699
IDETC-CIE 2010; 101-110doi:https://doi.org/10.1115/DETC2010-28741
IDETC-CIE 2010; 111-119doi:https://doi.org/10.1115/DETC2010-28814
IDETC-CIE 2010; 121-130doi:https://doi.org/10.1115/DETC2010-28882
IDETC-CIE 2010; 131-140doi:https://doi.org/10.1115/DETC2010-28971
IDETC-CIE 2010; 141-151doi:https://doi.org/10.1115/DETC2010-29066
IDETC-CIE 2010; 153-163doi:https://doi.org/10.1115/DETC2010-29069
IDETC-CIE 2010; 165-176doi:https://doi.org/10.1115/DETC2010-29157
IDETC-CIE 2010; 177-187doi:https://doi.org/10.1115/DETC2010-29236

Computational Multiphysics Applications

IDETC-CIE 2010; 189-195doi:https://doi.org/10.1115/DETC2010-28163
IDETC-CIE 2010; 197-210doi:https://doi.org/10.1115/DETC2010-28335
IDETC-CIE 2010; 211-212doi:https://doi.org/10.1115/DETC2010-28455
IDETC-CIE 2010; 213-222doi:https://doi.org/10.1115/DETC2010-28764

Computer-Aided Product and Process Development

IDETC-CIE 2010; 223-227doi:https://doi.org/10.1115/DETC2010-28206
IDETC-CIE 2010; 229-238doi:https://doi.org/10.1115/DETC2010-28211
IDETC-CIE 2010; 239-250doi:https://doi.org/10.1115/DETC2010-28226
IDETC-CIE 2010; 251-264doi:https://doi.org/10.1115/DETC2010-28272
IDETC-CIE 2010; 265-274doi:https://doi.org/10.1115/DETC2010-28294
IDETC-CIE 2010; 275-282doi:https://doi.org/10.1115/DETC2010-28301
IDETC-CIE 2010; 283-295doi:https://doi.org/10.1115/DETC2010-28544
Topics: Modeling
IDETC-CIE 2010; 297-310doi:https://doi.org/10.1115/DETC2010-28547
IDETC-CIE 2010; 311-322doi:https://doi.org/10.1115/DETC2010-28578
IDETC-CIE 2010; 323-339doi:https://doi.org/10.1115/DETC2010-28795
IDETC-CIE 2010; 341-351doi:https://doi.org/10.1115/DETC2010-28805
IDETC-CIE 2010; 353-361doi:https://doi.org/10.1115/DETC2010-28964
IDETC-CIE 2010; 363-372doi:https://doi.org/10.1115/DETC2010-29003
IDETC-CIE 2010; 373-382doi:https://doi.org/10.1115/DETC2010-29007
IDETC-CIE 2010; 383-389doi:https://doi.org/10.1115/DETC2010-29012
IDETC-CIE 2010; 391-403doi:https://doi.org/10.1115/DETC2010-29051
IDETC-CIE 2010; 405-413doi:https://doi.org/10.1115/DETC2010-29081
IDETC-CIE 2010; 415-422doi:https://doi.org/10.1115/DETC2010-29150

Design Informatics: Advances of Intelligent Information Processing and Knowledge Management in Engineering Design

IDETC-CIE 2010; 423-433doi:https://doi.org/10.1115/DETC2010-28014
IDETC-CIE 2010; 435-447doi:https://doi.org/10.1115/DETC2010-28179
IDETC-CIE 2010; 449-456doi:https://doi.org/10.1115/DETC2010-28353
IDETC-CIE 2010; 477-482doi:https://doi.org/10.1115/DETC2010-28452
IDETC-CIE 2010; 483-492doi:https://doi.org/10.1115/DETC2010-28499
IDETC-CIE 2010; 493-503doi:https://doi.org/10.1115/DETC2010-28548
IDETC-CIE 2010; 505-517doi:https://doi.org/10.1115/DETC2010-28670
IDETC-CIE 2010; 519-528doi:https://doi.org/10.1115/DETC2010-28774
IDETC-CIE 2010; 529-548doi:https://doi.org/10.1115/DETC2010-28937
IDETC-CIE 2010; 549-561doi:https://doi.org/10.1115/DETC2010-29052

Emotional Engineering

IDETC-CIE 2010; 563-568doi:https://doi.org/10.1115/DETC2010-28112
IDETC-CIE 2010; 569-579doi:https://doi.org/10.1115/DETC2010-28129
IDETC-CIE 2010; 581-586doi:https://doi.org/10.1115/DETC2010-28173
IDETC-CIE 2010; 587-594doi:https://doi.org/10.1115/DETC2010-28182
IDETC-CIE 2010; 595-603doi:https://doi.org/10.1115/DETC2010-28197
IDETC-CIE 2010; 605-614doi:https://doi.org/10.1115/DETC2010-28199
IDETC-CIE 2010; 615-621doi:https://doi.org/10.1115/DETC2010-28200
IDETC-CIE 2010; 623-631doi:https://doi.org/10.1115/DETC2010-28284
IDETC-CIE 2010; 633-642doi:https://doi.org/10.1115/DETC2010-28310
IDETC-CIE 2010; 643-649doi:https://doi.org/10.1115/DETC2010-28330
IDETC-CIE 2010; 651-656doi:https://doi.org/10.1115/DETC2010-28586
IDETC-CIE 2010; 657-665doi:https://doi.org/10.1115/DETC2010-28613
IDETC-CIE 2010; 667-672doi:https://doi.org/10.1115/DETC2010-28624
IDETC-CIE 2010; 673-678doi:https://doi.org/10.1115/DETC2010-28639
IDETC-CIE 2010; 679-686doi:https://doi.org/10.1115/DETC2010-28812
IDETC-CIE 2010; 687-695doi:https://doi.org/10.1115/DETC2010-28877
IDETC-CIE 2010; 697-703doi:https://doi.org/10.1115/DETC2010-29223
IDETC-CIE 2010; 705-710doi:https://doi.org/10.1115/DETC2010-29229

Energy Systems

IDETC-CIE 2010; 711-718doi:https://doi.org/10.1115/DETC2010-28045
IDETC-CIE 2010; 719-722doi:https://doi.org/10.1115/DETC2010-28106
IDETC-CIE 2010; 723-731doi:https://doi.org/10.1115/DETC2010-28136
IDETC-CIE 2010; 733-739doi:https://doi.org/10.1115/DETC2010-28348
IDETC-CIE 2010; 741-748doi:https://doi.org/10.1115/DETC2010-28349
IDETC-CIE 2010; 749-754doi:https://doi.org/10.1115/DETC2010-29056
IDETC-CIE 2010; 755-760doi:https://doi.org/10.1115/DETC2010-29101

High Performance Computing

IDETC-CIE 2010; 761-766doi:https://doi.org/10.1115/DETC2010-28522
IDETC-CIE 2010; 767-775doi:https://doi.org/10.1115/DETC2010-28736
IDETC-CIE 2010; 777-789doi:https://doi.org/10.1115/DETC2010-28804
IDETC-CIE 2010; 791-794doi:https://doi.org/10.1115/DETC2010-28944
IDETC-CIE 2010; 795-806doi:https://doi.org/10.1115/DETC2010-29073
IDETC-CIE 2010; 807-814doi:https://doi.org/10.1115/DETC2010-29135

Inverse Problems in Science and Engineering

IDETC-CIE 2010; 815-825doi:https://doi.org/10.1115/DETC2010-28486
IDETC-CIE 2010; 827-834doi:https://doi.org/10.1115/DETC2010-28603
IDETC-CIE 2010; 835-842doi:https://doi.org/10.1115/DETC2010-28696
IDETC-CIE 2010; 843-849doi:https://doi.org/10.1115/DETC2010-28859
IDETC-CIE 2010; 851-857doi:https://doi.org/10.1115/DETC2010-29130

Modeling Tools and Metrics for Sustainable Manufacturing

IDETC-CIE 2010; 859-866doi:https://doi.org/10.1115/DETC2010-28347
IDETC-CIE 2010; 867-873doi:https://doi.org/10.1115/DETC2010-28713
IDETC-CIE 2010; 875-883doi:https://doi.org/10.1115/DETC2010-28743
IDETC-CIE 2010; 885-889doi:https://doi.org/10.1115/DETC2010-28913
IDETC-CIE 2010; 891-897doi:https://doi.org/10.1115/DETC2010-28959
IDETC-CIE 2010; 899-908doi:https://doi.org/10.1115/DETC2010-29171

Product-Service Systems Design

IDETC-CIE 2010; 909-920doi:https://doi.org/10.1115/DETC2010-28382
IDETC-CIE 2010; 921-934doi:https://doi.org/10.1115/DETC2010-29025
Topics: Design

Prognostics and Health Management

IDETC-CIE 2010; 935-945doi:https://doi.org/10.1115/DETC2010-28255
IDETC-CIE 2010; 947-958doi:https://doi.org/10.1115/DETC2010-28344
IDETC-CIE 2010; 959-967doi:https://doi.org/10.1115/DETC2010-28438
IDETC-CIE 2010; 969-975doi:https://doi.org/10.1115/DETC2010-28497
IDETC-CIE 2010; 977-988doi:https://doi.org/10.1115/DETC2010-29034
IDETC-CIE 2010; 989-996doi:https://doi.org/10.1115/DETC2010-29142
IDETC-CIE 2010; 997-1001doi:https://doi.org/10.1115/DETC2010-29143
IDETC-CIE 2010; 1003-1011doi:https://doi.org/10.1115/DETC2010-29161
IDETC-CIE 2010; 1013-1022doi:https://doi.org/10.1115/DETC2010-29181
IDETC-CIE 2010; 1023-1032doi:https://doi.org/10.1115/DETC2010-29182
IDETC-CIE 2010; 1033-1038doi:https://doi.org/10.1115/DETC2010-29232

Sampling Based Geometric Modeling and Computing

IDETC-CIE 2010; 1039-1048doi:https://doi.org/10.1115/DETC2010-28904
IDETC-CIE 2010; 1049-1061doi:https://doi.org/10.1115/DETC2010-29094
IDETC-CIE 2010; 1063-1074doi:https://doi.org/10.1115/DETC2010-29125
IDETC-CIE 2010; 1075-1083doi:https://doi.org/10.1115/DETC2010-29192

Systems Engineering, Information and Knowledge Management

IDETC-CIE 2010; 1085-1098doi:https://doi.org/10.1115/DETC2010-28183
IDETC-CIE 2010; 1099-1108doi:https://doi.org/10.1115/DETC2010-28213
IDETC-CIE 2010; 1109-1118doi:https://doi.org/10.1115/DETC2010-28315
IDETC-CIE 2010; 1119-1127doi:https://doi.org/10.1115/DETC2010-28409
IDETC-CIE 2010; 1129-1140doi:https://doi.org/10.1115/DETC2010-28589
IDETC-CIE 2010; 1141-1148doi:https://doi.org/10.1115/DETC2010-28615
IDETC-CIE 2010; 1149-1158doi:https://doi.org/10.1115/DETC2010-28636
IDETC-CIE 2010; 1159-1171doi:https://doi.org/10.1115/DETC2010-28706
IDETC-CIE 2010; 1173-1182doi:https://doi.org/10.1115/DETC2010-28711
IDETC-CIE 2010; 1183-1190doi:https://doi.org/10.1115/DETC2010-28763
IDETC-CIE 2010; 1191-1201doi:https://doi.org/10.1115/DETC2010-28765
IDETC-CIE 2010; 1203-1212doi:https://doi.org/10.1115/DETC2010-28773
IDETC-CIE 2010; 1213-1220doi:https://doi.org/10.1115/DETC2010-28833
IDETC-CIE 2010; 1221-1230doi:https://doi.org/10.1115/DETC2010-28868
IDETC-CIE 2010; 1231-1245doi:https://doi.org/10.1115/DETC2010-28960
IDETC-CIE 2010; 1247-1257doi:https://doi.org/10.1115/DETC2010-28989
IDETC-CIE 2010; 1259-1270doi:https://doi.org/10.1115/DETC2010-29005
IDETC-CIE 2010; 1271-1286doi:https://doi.org/10.1115/DETC2010-29016
IDETC-CIE 2010; 1287-1298doi:https://doi.org/10.1115/DETC2010-29048
IDETC-CIE 2010; 1299-1308doi:https://doi.org/10.1115/DETC2010-29077
IDETC-CIE 2010; 1309-1316doi:https://doi.org/10.1115/DETC2010-29123

Virtual Environments and Systems

IDETC-CIE 2010; 1317-1325doi:https://doi.org/10.1115/DETC2010-28155
IDETC-CIE 2010; 1327-1334doi:https://doi.org/10.1115/DETC2010-28250
IDETC-CIE 2010; 1335-1344doi:https://doi.org/10.1115/DETC2010-28416
IDETC-CIE 2010; 1345-1355doi:https://doi.org/10.1115/DETC2010-28443
IDETC-CIE 2010; 1357-1364doi:https://doi.org/10.1115/DETC2010-28572
IDETC-CIE 2010; 1365-1372doi:https://doi.org/10.1115/DETC2010-28695
IDETC-CIE 2010; 1373-1380doi:https://doi.org/10.1115/DETC2010-28732
IDETC-CIE 2010; 1381-1390doi:https://doi.org/10.1115/DETC2010-28841
IDETC-CIE 2010; 1391-1400doi:https://doi.org/10.1115/DETC2010-28845
IDETC-CIE 2010; 1401-1411doi:https://doi.org/10.1115/DETC2010-28975
IDETC-CIE 2010; 1413-1420doi:https://doi.org/10.1115/DETC2010-29140
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